Calculating Some Topological Indices of SiO\(_2\) Layer Structure

Authors

  • Fatima Farrukh School of Natural Sciences, National University of Sciences and Technology, H-12, Islamabad
  • Sabeel- e- Hafi School of Natural Sciences, National University of Sciences and Technology, H-12, Islamabad
  • Rashid Farooq School of Natural Sciences, National University of Sciences and Technology, H-12, Islamabad
  • Mohammad R. Farahani Department of Applied Mathematics, Iran University of Science and Technology, Narmak, Tehran

DOI:

https://doi.org/10.26713/jims.v8i3.445

Keywords:

Degree based indices, Topological indices, SiO\(_2\) layer structure

Abstract

Topological indices are closely related to the toxicological, physicochemical, pharmacological etc. properties of a chemical compound. This paper focuses on calculating topological indices namely Randić index, sum-connectivity index, reciprocal Randić index, reduced second Zagreb index and reduced reciprocal Randić index of SiO\(_2\) layer structure for all values of \(p\) and \(q\).

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References

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Published

2016-11-15
CITATION

How to Cite

Farrukh, F., Hafi, S.-. e-., Farooq, R., & Farahani, M. R. (2016). Calculating Some Topological Indices of SiO\(_2\) Layer Structure. Journal of Informatics and Mathematical Sciences, 8(3), 181–187. https://doi.org/10.26713/jims.v8i3.445

Issue

Vol. 8 No. 3 (2016)

Section

Research Articles

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