Nonlinear Refractive Index of Silicon Nanoparticles: A Short Review

Sudakshina Prusty


This article discusses the nonlinear refractive index of silicon nanoparticles starting from the basic formalism to some of the consequent physical phenomena like self focusing and self phase modulation. Several experimental techniques mainly based on Z-scan are discussed to measure the nonlinear refractive index. Another less explored technique for silicon nanoparticles, which studies the far-field optical fringe pattern formed by spatial self-phase modulation, is also discussed. Computation of the nonlinear refractive index is shown in detail by employing these two techniques. While Z-scan can estimate the nonlinear coefficient of a medium in a chosen time scale, the optical fringe method can predict the overall nonlinear refractive index due to all possible physical mechanisms. Some of the recent results for silicon nanoparticles using these two techniques are also discussed.

Full Text:



N. Daldosso and L. Pavesi, Nanosilicon, edited by Vijay Kumar (Elsevier, New York, 2005), Chapter 1.

R. Chen, D.L. Lin and B. Mendoza, Phys. Rev. B 48, 11879 (1993).

P. Maly, J. Kudrna, F. Trojanek and A. Hospodkova, Thin Solid Films 276, 84 (1996).

F.Z. Henari, K. Morgenstern, W.J. Blau, V.A. Karavanskii and V.S. Dneprovskii, Appl. Phys. Lett. 67, 323 (1995).

S. Vijayalakshmi, M.A. George and H. Grebel, Appl. Phys. Lett. 70, 708 (1997).

G. Vijayaprakash, M. Cazzanelli, Z. Gaburro, L. Pavesi, F. Iacona, G. Franzo and F. Priolo, J. Appl. Phys. 91 4607, (2002).

M. Takahashi, Y. Toriumi, T. Matsumoto, Y. Masumoto and N. Koshida, Appl. Phys. Lett. 76 1990, (2000).

S. Lettieri, O. Fiore, P. Maddalena, D. Ninno, G.D. Francia, V. La Ferrara, Opt. Commun. 168 383, (1999).

S. Lettieri, O. Fiore, P. Maddalena, A. Morra and D. Ninno, Philosphical Mag. B 81 133, (2001).

S. Vijayalakshmi, H. Grebel, G. Yaglioglu, R. Pino, R. Dorsinville and C.W. White, J. Appl. Phys. 88 6418, (2000).

S. Vijayalakshmi, M.A. George and H. Grebel, Appl. Phys. Lett. 70, 708 (1997).

D. Cotter, M.G. Burt and R.J. Manning, Phys. Rev. Lett. 68, 1200 (1992).

Demonstration of an all-optical logic gate, within the European Project Phologic (Contract HP6-017158), based on the nonlinear optical response of Si-nc.

B.B. Laud, Lasers and Nonlinear Optics, New Age International, India, 173 (1991).

R. Adair, L.L. Chase and S.A. Payne, Phys. Rev. B, 39, 3337 (1989).

Y.R. Shen, The Principles of Nonlinear Optics, John Wiley & Sons, New York, 303 (1984).

S. Prusty, H.S. Mavi and A.K. Shukla, Phy. Rev. B 71, 113313 (2005).

C.M. Nascimento, M.A.R.C. Alencar, S. Chavez-Cerda, M.G.A. da Silva, M.R. Meneghetti and J.M. Hickmann, J. Opt. A: Pure Appl. Opt. 8, 947 (2006).

M.H. MajlesAra, Z. Dehghani, R. Sahraei, A. Daneshfar, Z. Javadi and F. Divsar, Journal of Quantitative Spectroscopy & Radiative Transfer 113, 366 (2012).

H. Ono, Y. Harato, Jpn. J. Appl. Phys. 37, 4061 (1998).

M.J. Moran, C.Y. She and R.L. Carman, IEEE J. Quantum Electron. 11, 259 (1975).

S.R. Friberg and P.W. Smith, IEEE J. Quantum Electron. 23, 2089 (1987).

R. Adair, L.L. Chase and S.A. Payne, J. Opt. Soc. Am. B, 4, 875 (1987).

A. Owyoung, IEEE J. Quantum Electron. 9, 1064 (1973).

W.E. Williams, M.J. Soileau and E.W. Van-Stryland, Opt. Commun. 50, 256 (1984).

M. Sheik-Bahae, A.A. Said, T. Wei, D.J. Hagan and E.W. Van-Stryland, IEEE J. Quantum Electron. 26, 760 (1990).

C.S. Yelleswarapu and S.R. Kothapalli, Optics Express 18, 9020 (2010).

A.S.L. Gomes, E.L. Falcao Filho and Cid B. de Araújo, Diego Rativa and R.E. de Araujo, Optics Express 15, 1712 (2007).

S. Hernandez, P. Pellegrino, A. Martinez, Y. Lebour, B. Garrido, R. Spano, M. Cazzanelli, N. Daldosso, L. Pavesi, E. Jordana and J.M. Fedeli, J. App. Phy. 103, 064309 (2008).

A. Martinez, S. Hernandez, P. Pellegrino, O. Jambois, B. Garrido, E. Jordana and J.M. Fedeli, J. App. Phy. 108, 014311 (2010).

M. Ito, K. Imakita, M. Fujii and S. Hayashi, J. Appl. Phys. 108, 063512 (2010).

M. Ito, K. Imakita, M. Fujii and S. Hayashi, J. Phys. D: Appl. Phys. 43, 505101 (2010).

A. Petris, F. Pettazzi, E. Fazio, 1378; C. Peroz, Y. Chen, V.I. Vlad and M. Bertolotti, J. Optoelectronics & Advanced Materials 8, 1377 (2006).

L. Deng, K. He, T. Zhou and C. Li, J. Opt. A: Pure Appl. Opt. 7 409, (2005).



  • There are currently no refbacks.

RGN Journal Management System is fully compatible with all dialects of \(\rm\LaTeX\) and \(\sf MathML\)

  eISSN 2349-2716; pISSN 2349-6088